ACM SIGSOFT International Symposium on Software Testing a… · 2024 · Conference paper

Certified Continual Learning for Neural Network Regression

Long Pham, Jun Sun

Singapore Management University

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Published in
Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis
Date
2024-09-11
Citations
5
arXiv
2407.06697
Cite
@inproceedings{pham2024certified,
  title = {Certified Continual Learning for Neural Network Regression},
  author = {Long Pham and Jun Sun},
  year = {2024},
  booktitle = {Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis},
  eprint = {2407.06697},
  archivePrefix = {arXiv},
  doi = {10.1145/3650212.3680322},
  url = {https://arxiv.org/abs/2407.06697},
}