KDD · 2015 · Conference paper

Quick Sensitivity Analysis for Incremental Data Modification and Its Application to Leave-one-out CV in Linear Classification Problems

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Published in: Proceedings of the 21th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
Date: 2015-08-07
Citations: 19
arXiv: 1504.02870 ↗

Cite

@inproceedings{okumura2015quick,
  title = {Quick Sensitivity Analysis for Incremental Data Modification and Its Application to Leave-one-out CV in Linear Classification Problems},
  author = {Shota Okumura and Y. Suzuki and Ichiro Takeuchi},
  year = {2015},
  booktitle = {Proceedings of the 21th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining},
  eprint = {1504.02870},
  archivePrefix = {arXiv},
  doi = {10.1145/2783258.2783347},
  url = {https://arxiv.org/abs/1504.02870},
}