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IEEE 30th International Symposium on Industrial Electroni… · 2021 · Conference paper

Residual Knowledge Retention For Edge Devices

Cheng-Fu Liou, Paul Kuo, Jiun-In Guo

National Yang Ming Chiao Tung University · Advantech (Taiwan) · Pervasive Artificial Intelligence Research Labs

Publisher page ↗
Published in
2021 IEEE 30th International Symposium on Industrial Electronics (ISIE)
Date
2021-06-20
Citations
1
Cite
@inproceedings{liou2021residual,
  title = {Residual Knowledge Retention For Edge Devices},
  author = {Cheng-Fu Liou and Paul Kuo and Jiun-In Guo},
  year = {2021},
  booktitle = {2021 IEEE 30th International Symposium on Industrial Electronics (ISIE)},
  doi = {10.1109/isie45552.2021.9576374},
  url = {https://doi.org/10.1109/isie45552.2021.9576374},
}