Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems
- 2026-08-17
- 0
@article{li2026measurement,
title = {Measurement of silicon carbide epilayer thickness using physics-informed neural networks and hybrid intelligent systems},
author = {Chang-Yuan Li and Dengkui Li},
year = {2026},
journal = {Intelligence & Robotics},
doi = {10.20517/ir.2026.23},
url = {https://doi.org/10.20517/ir.2026.23},
}