CVPR · 2018 · Conference paper

New Metrics and Experimental Paradigms for Continual Learning

Tyler L. Hayes, Ronald Kemker, Nathan D. Cahill, Christopher Kanan

Rochester Institute of Technology

Published in
2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
Date
2018-06-01
Citations
38
Cite
@inproceedings{hayes2018metrics,
  title = {New Metrics and Experimental Paradigms for Continual Learning},
  author = {Tyler L. Hayes and Ronald Kemker and Nathan D. Cahill and Christopher Kanan},
  year = {2018},
  booktitle = {2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)},
  doi = {10.1109/CVPRW.2018.00273},
  url = {https://doi.org/10.1109/CVPRW.2018.00273},
}